Product Information 

The UI-192A series of digita✔≥σ‍l modules for the VXIbus provides the ≤¥ basis for a complete state-of-the-ar↔↑✔'t digital solution at the subsystem le≈€£ vel. The UI-192A is σ×the solution for bothλ₹¥λ legacy digital replacement →‍Ω∏and new test stations to be bu✘δ™☆ilt for digital testγ≈☆☆ including aircraft/avionics, weapons ≠¥'systems, spacecraft, semicond≤♦σπuctors and medical devices. ™♦';

We exploit the VXI 3.0 and 4.0 platfor∏ ms to produce highly-capabλ±le and reliable digital subsyste©♥ms that are backed by ∏♦Ω×our proprietary digital sequencer a'↔rchitecture. 

The UI-192A has been designe←β★d using Field Programmabl♦☆♣e Gate Arrays (FPGA) an≠€β←d pin-driver technologies plu☆÷€εs an advanced sequencer, provid™ →∑ing a choice of fixed or variableλ÷ driver/receiver personal¶✔γ±ity modules to create flexible digita‍§l instrumentation. ♥✘;

Bus-Emulation Meets Stimulus/

Response

For years, the test engineer faced l∏§ess than

desirable alternatives when selectinλδ∏g a

digital resource. Early digital p‌↔¶αroducts were

basic stimulus/response architecφ✔tures,

were expensive, consumed abundant&nb  ←≥sp;

realestate,and were powe♣₽r-hungry. They also

required extensive programming to emula$>te

a relatively simple digital in♥φterface.

For many applications, these φ≈Ωbus emulation

products significantly red≈‌♣uced cost, realestate,

power, and programming requirements<→>.

However, the another question for the∏α¥ test 

engineer: Does the test system req₹≈∏↓uire bus 

emulation or a traditional stimulus/re↔‍sponse

 digital resource?

The United Instrument∏✘↑÷s™ UI-192A solves

this dilemma by integrating both bus-×♠<₽emulation

and stimulus/response architectures

into a single resourc∏λ¶e for the VXIbus.

Advanced Features for Modern Digita✘φ★φl Test Development 

The UI-192A’s innovat©©ive design is suitable for♣∑ today’s challenging digit♠  al test system applications. Th≥×e flexible FPGA design enable•☆s the 192A to meet special user and '≈≥♣legacy requirements. The h↕>γ→igh-speed data sequencer provid↓£φ↕es control over test p​δ<atterns, timing, and format.&nbs☆πλp;